DS8000-R Rack Oscilloscope — catalog figure
DS8000-R Rack Oscilloscope catalog figure. Figures may include labels or related components. Final supplied scope is confirmed in the quotation. Image source ↗

Oscilloscopes

DS8000-R Rack Oscilloscope

DS8000-R series waveform measurements with catalog bandwidth options of 350 MHz / 1 / 2 GHz.

Oscilloscope measurement platformLaboratory & research enquiries

Share your experiment, required configuration and quantity for a quotation.

Product overview

The DS8000-R series is listed in SSI’s test and measurement portfolio for waveform acquisition. Select bandwidth, channels, acquisition memory and probe interfaces around the signals being measured. The specifications below are catalog series limits or options, not a statement that every variant includes the maximum configuration.

Specifications & ordering details

Use these parameters to define your requirement. The quotation confirms the exact supplied specification.

System / methodOscilloscope measurement platform
Catalog seriesDS8000-R
Bandwidth options350 MHz / 1 / 2 GHz
Channels4 analog
Maximum sample rate10 GSa/s
Vertical resolution8-bit
Memory500 Mpts
DisplayNo integrated display listed
Configuration noteModel and option dependent; confirm exact configuration
Bandwidth and analog/digital channelsSpecify with your requirement.
Sample rate, memory and probe requirementsSpecify with your requirement.
Measurement and software optionsSpecify with your requirement.

Research applications

  • Waveform acquisition
  • Electronic circuit debugging
  • Laboratory measurements

Before you order

  • Specify bandwidth, analog/digital channels and measurement tasks.
  • Confirm probe types, acquisition memory and software options.
  • Provide signal levels and electrical interface requirements.

Product documents

View the source catalog for this offering. Share your instrument model, configuration and application to request the relevant specification or material documentation.

View Test & Measurement Portfolio — page 4 ↗Download PDF

Selection questions

How do I check the instrument interface?

Share the instrument make and model, sample geometry, optical or beam path, mounting arrangement and drawings. The cell and instrument interfaces must be reviewed together.

Which experimental conditions are needed?

Specify temperature, pressure, atmosphere or electrolyte, and electrical connections. Confirm sample access, windows, fittings and accessories for the selected method.